Field Emission - Scanning Electron Microscope (FE-SEM) Completed with Maps Mineralogy

Source :

1. High-resolution field emission SEM column with a highstability Schottky field emission gun to provide stable high-resolution analytical currents
2. 45° objective lens geometry with heated objective apertures
3. Through-the-lens differential pumping reduces beam skirting for the most accurate analysis and highest resolution

Accelerating Voltage : Range 200 V to 30 kV 

Probe Current : Beam current range: 1 pA to 200 nA                               

Resolution : 

High Vacuum Imaging           

1. 1.0 nm @ 30 kV (SE)
2. 2.5 nm @ 30 kV (BSE)
3. 3.0 nm @ 1 kV (SE)

Low Vacuum Imaging            

1. 1.3 nm @ 30 kV (SE)
2. 2.5 nm @ 30 kV (BSE)
3. 3.0 nm at 3 kV (SE)

Extended vacuum mode (ESEM)       

1. 1.3 nm at 30 kV (SE)                                  

Magnification : 6 - 2.500.000x           

Vacuum mode : 

1. High vacuum: < 6 x 10-4 Pa
2. Low vacuum: up to 200 Pa
3. ESEM: up to 4000 Pa                              

Vacuum system :        

1. 1 × 250 liter/s TMP
2. 1 × PVP
3. 2 × IGP
4. Patented through-the-lens differential pumping
5. Beam gas path length: 10 mm or 2 mm                    

Detector :        

1. ETD – Everhart-Thornley SE detector
2. Low-vacuum SE detector (LVD)
3. Gaseous SED (GSED) (used in ESEM mode)
4. IR camera for viewing sample in chamber

Solid-State Detector Integration Kit : 

1. It allows having all three solid-state detectors connected simultaneously and provides support for up to twelve signal channels, 
2. This allows access to all solid-state detector segments                          

Retractable DBS Detector :    

1. Ultra-sensitive, solid state detector which is sensitive to emitted electrons from 500 V onward
2. Mounted on a software-controlled retractable arm and allows simultaneous EDS spectra acquisition for WD ≥ 10 mm.
3. An inner (materials contrast) and an outer (topography) concentric segment
4. Detector can be used in high-vacuum, low-vacuum and in ESEM mode.

Dual EDS Detector :   

1. 2 unit of EDS Detector
2. Silicon drift detector with active area of 30 mm2
3. Detects elements from Be to Am
4. Liquid nitrogen (LN2) free, using thermoelectric peltier cooling
5. Mapping, LineScan, Spectrum acquisition

MAPS Mineralogy :

1. Advanced fully automated spatial mineralogy solution combining ultra-high resolution imaging hardware with the highest throughput and anlytical performance to create accurate and statistically robust data
2. Combines BSE imaging with EDS acquisition to build accurate pictures of particles and standard rock thin sections
3. Advanced mineral classification approach combinies unique patent-protect capabilities including: Accurate, automated sub-micron identification and quantification of minerals, Direct mineral/mineral associations, Rapid multi-elemental mapping
4. Advanced image analysis and reporting software
5. Creation and viewing images, tables and charts 
6. General-purpose and proven application specific reports (Liberation, locking, grain size, etc.) 
7. Property based filtering, sorting and classification; 
8. Database management system to combine data from multiple batches, samples and size fractions into a single report; 
9. Built-in mineral database of mineral compositions, densities hardness and other properties; 
10. Export of images, tables, and charts to image analysis, word-processing and spread-sheet software; 
11. Over 4000 integrated mineral species; 
12. Stiching automation: Multi-scale acquisition, easy setup.

MAPS 3 : 

1. Maps provides automated acquisition of image mosaics via easy set up and offers complete control on location, resolution and imaging parameters, 
2. Maps corrects for non-linear stage behavior to increase navigation accuracy, 
3. Maps supports batch acquisition, allowing the user to schedule acquisition of multiple areas in one job, saving supervised time, 
4. Microscope real-time stitching of tiled images can be carried out concurrent with image acquisition, 
5. Maps also makes it easy to re-align and collect data over multiple imaging sessions 

     In-Chamber Nav-Cam :          

1. Automatic image acquisition with sample lighting
2. 160 x 105 mm field of view
3. 3072 x 2048 pixels or approximately 6 megapixels
4. Digital zoom
5. Image annotation
6. Image save                       

Holder :           

1. Standard multi-sample SEM holder, uniquely mounts directly onto the stage, hosts up to 18 standard stubs (⌀ 12 mm)
2. 10 x 30 mm block holder
3. 16 x 25 mm block holder

Chamber :       

1. Inside width: 340 mm
2. Analytical working distance: 10 mm
3. Ports: 12                           

Sample Stage: 

1. Type : Eucentric goniometer stage,
2. 5-axes motorized
3. XY 110 × 110 mm
4. Repeatability < 3.0 μm (@ 0° tilt)
5. Motorized Z 65 mm
6. Rotation n × 360°
7. Tilt -15° / +90°
8. Max. sample height Clearance 85 mm to eucentric point (10 mm)
9. Max. sample weight 500 g in any stage position (up to 2 kg at 0° tilt)
10. Max. sample size 122 mm diameter with full X,Y, rotation (larger samples possible with limited stage travel or rotation)   

FESEM Image Processor :      

1. Dwell time range from 25 ns – 25 ms/pixel
2. Up to 6144 × 4096 pixels
3. File type: TIFF (8, 16, 24 bit), JPEG or BMP
4. Single-frame or 4-view image display
5. SmartSCAN™ (256-frame average or integration, line integration and averaging, interlaced scanning)
6. DCFI (Drift Compensated Frame Integration)

System Control :

1. 64-bit GUI with Windows, keyboard, optical mouse
2. 24-inch LCD display, WUXGA 1920 × 1200
3. Navigation montage Software
4. Undo / Redo functionality
5. Customizable graphical user interface, with up to 4 simultaneously active images
6. User guidance software enabling new or infrequent users to obtain excellent results                              

Manual User Interface :          

1. Supplementary control console providing direct manual control of microscope parameters such as focus, magnification, contrast, brightness, beam shift and stigmator.

Maintenance Support : Remote Diagnostic                            

Compressor :

1. Compressor 230 V, 50/60 Hz with 4-liter Tank
2. Compressed air is required for operating pneumatic valves and the microscope's leveling system 
3. The compressor is connected to the mains supply unit of the microscope.

Chiller :

1. Air-cooled Water Chiller 230 V, 50/60 Hz
2. Continuous cooling between 5°C and 40°C 
3. Stability of 0.1 °C
4. Cooling capacity: up to 1100/1300 W      

  Sample Standard :

1. High resolution test specimen, Gold on Carbon, 1 pc
2. Magnification calibration grating replica, 1 pc
3. EDS calibration and contains ANSI 316 stainless steel, SiO2, Mn, B, C and a 200 mesh Cu grid in a 12.7mm aluminum pin stub

SEM Starter Kits :

1. Polyprop Sorting Box,5 CMPT,EA, 1 pc
2. Carbon Cond. Tape,12MM X 20M, 18 pcs
3. Pin Mount AL.12.7X11MM,8MM PIN, 200 pcs
4. SEM Pin MNT 25.4MM,9.5MM PIN H, 50 pcs
5. Pelco 12.7MM Pin MNT Gripper, 1 pc
6. Pelco 25MM Pin MNT Gripper, EA, 1 pc
7. Storage Box For 14 Pin Mounts, 1 pc
8. Split Specimen Mount, 1/2x1/8", 2 pcs

Materials for Installation :

1. Uninterruptible Power Supply (UPS) GE LP 8 kVA 
2. 1 Unit of Gas Nitrogen UHP (99,9995%), 7,5 M3 (Includes cylinder, Hose, and regulators)
3. EMO Box, Safety Emergency Off button for fast power shut downs with electronics
4. Generator Set 10 kVA
5. 1 Unit of Gas Argon, (Includes cylinder, Hose, and regulators) 
6. Working desk and chair for operator,
7. Printer
8. Installation dan Training                          

Sample Preparation :   

1. Sputter Coater with Au source
2. Carbon Coater
3. Precision low-speed saw 
4. Grinding and Polishing with Power Head completed with resin package